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Partector TEM
The Naneos Partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid. The TEM is the most powerful analytical technique when it comes to single particle analysis. The Partector TEM gives the most capability if you have the supplementary tools such as a TEM/SEM microscope for further looking at particle size distributions and particle morphology and/or analytical instruments for chemical composition of the sampled particles.
The Partector TEM allows you to assess workplace safety comprehensively with a single instrument. The Partector TEM sampler is the only nanoparticle sampler that can determine the coverage of the sample online, and stop sampling when the optimal coverage is reached. It is an integrated measurement that allows one to survey first, then sample only when necessary. Since the TEM deposition mechanism is controlled and monitored by the concentration detected, you will never have empty or overloaded samples again. Utilizing a Google Earth Java tool it can show where concentrations were measured.
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